Semiconductor device, semiconductor device testing method, and probe card
US7902853B2 · kind B2 · utility
0Cited by
11References
10Claims
0Family size
Assignee
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Key dates
| Filing date | May 22, 2007 |
| Grant date | Mar 8, 2011 |
| Priority date | — |
| Expiry date | Feb 5, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test signal to be supplied to a driver section when the driver section is subjected to an operation test is generated by a test circuit. In the test circuit, the test signal can be generated by a burn-in control circuit in accordance with a clock signal TESTCK supplied from an outside source.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.