Ren Uchida
2Patents
1h-index
1Co-inventors
30Inventor score
Filing activity: Aug 30, 2001 → May 22, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6879174B2 | Testing method and testing device for semiconductor integrated circuits | Physics | 7 | Expired |
| US7902853B2 | Semiconductor device, semiconductor device testing method, and probe card | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.