Patent · US Active

On-chip comparison and response collection tools and techniques

US7913137B2 · kind B2 · utility

45Cited by

61References

5Claims

0Family size

Assignee

MENTOR GRAPHICS CORPORATION · US

Inventors

Nilanjan Mukherjee · Wilsonville, US
Janusz Rajski · West Linn, US
Jerzy Tyszer · Poznań, PL

Key dates

Filing date	Feb 20, 2007
Grant date	Mar 22, 2011
Priority date	—
Expiry date	Mar 18, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318566
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Disclosed herein are exemplary embodiments of a so-called “X-press” test response compactor. Certain embodiments of the disclosed compactor comprise an overdrive section and scan chain selection logic. Certain embodiments of the disclosed technology offer compaction ratios on the order of 1000×. Exemplary embodiments of the disclosed compactor can maintain about the same coverage and about the same diagnostic resolution as that of conventional scan-based test scenarios. Some embodiments of a scan chain selection scheme can significantly reduce or entirely eliminate unknown states occurring in test responses that enter the compactor. Also disclosed herein are embodiments of on-chip comparator circuits and methods for generating control circuitry for masking selection circuits.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.