Inventor · Poznań, PL

Jerzy Tyszer

83Patents
28h-index
26Co-inventors
88Inventor score

Filing activity: Jun 11, 1993 → Nov 17, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US5991898A Arithmetic built-in self test of multiple scan-based integrated circuits Physics 174 Expired
US5991909A Parallel decompressor and related methods and apparatuses Physics 149 Expired
US6557129B1 Method and apparatus for selectively compacting test responses Physics 136 Expired
US6327687A Test pattern compression for an integrated circuit test environment Physics 128 Expired
US6684358B1 Decompressor/PRPG for applying pseudo-random and deterministic test patterns Physics 113 Expired
US6728901B1 Arithmetic built-in self-test of multiple scan-based integrated circuits Physics 89 Expired
US6829740B2 Method and apparatus for selectively compacting test responses Physics 86 Expired
US6543020B2 Test pattern compression for an integrated circuit test environment Physics 86 Expired
US7093175B2 Decompressor/PRPG for applying pseudo-random and deterministic test patterns Physics 62 Expired
US6874109B1 Phase shifter with reduced linear dependency Physics 61 Expired
US6353842B1 Method for synthesizing linear finite state machines Physics 61 Expired
US7111209B2 Test pattern compression for an integrated circuit test environment Physics 59 Expired
US7370254B2 Compressing test responses using a compactor Physics 50 Expired
US7818644B2 Multi-stage test response compactors Physics 50 Active
US6708192B2 Method for synthesizing linear finite state machines Physics 48 Expired
US6539409B2 Method for synthesizing linear finite state machines Physics 46 Expired
US7913137B2 On-chip comparison and response collection tools and techniques Physics 45 Active
US7797603B2 Low power decompression of test cubes Physics 42 Active
US7500163B2 Method and apparatus for selectively compacting test responses Physics 41 Expired
US7260591B2 Method for synthesizing linear finite state machines Physics 33 Expired
US7263641B2 Phase shifter with reduced linear dependency Physics 32 Expired
US7647540B2 Decompressors for low power decompression of test patterns Physics 31 Active
US7493540B1 Continuous application and decompression of test patterns to a circuit-under-test Physics 31 Expired
US7506232B2 Decompressor/PRPG for applying pseudo-random and deterministic test patterns Physics 31 Active
US7302624B2 Adaptive fault diagnosis of compressed test responses Physics 30 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.