Method and system for modeling uncertainties in integrated circuits, systems, and fabrication processes
US7920992B2 · kind B2 · utility
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Key dates
| Filing date | Mar 8, 2006 |
| Grant date | Apr 5, 2011 |
| Priority date | — |
| Expiry date | Aug 3, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for modeling uncertainties in integrated circuits, systems and fabrication processes may include defining interval values for each uncertain component or parameter in a circuit or system. The method may also include replacing scalar operations with interval operations in an algorithm and discontinuing interval operations in the algorithm in response to a predetermined condition. The method may also include generating a plurality of scalar samples from a plurality of intervals and determine a distribution of each uncertain component or parameter from the scalar samples of the intervals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.