Amith Singhee
51Patents
5h-index
102Co-inventors
71Inventor score
Filing activity: Mar 11, 2005 → Dec 6, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8510699B1 | Performance driven layout optimization using morphing of a basis set of representative layouts | Physics | 14 | Active |
| US8155938B2 | Method and apparatus for sampling and predicting rare events in complex electronic devices, circuits and systems | Physics | 14 | Active |
| US9882782B2 | Network management using hierarchical and multi-scenario graphs | Electricity | 10 | Active |
| US8290761B1 | Method and apparatus for rapidly modeling and simulating intra-die statistical variations in integrated circuits using compressed parameter models | Physics | 8 | Active |
| US9536214B2 | Weather-driven multi-category infrastructure impact forecasting | Physics | 6 | Active |
| US10805382B2 | Resource position planning for distributed demand satisfaction | Electricity | 4 | Active |
| US10387802B2 | Weather-driven multi-category infrastructure impact forecasting | Physics | 4 | Active |
| US7920992B2 | Method and system for modeling uncertainties in integrated circuits, systems, and fabrication processes | Physics | 4 | Active |
| US9893948B2 | Network management using hierarchical and multi-scenario graphs | Electricity | 4 | Active |
| US10574533B2 | Network management using hierarchical and multi-scenario graphs | Electricity | 3 | Active |
| US10810647B2 | Hybrid virtual and physical jewelry shopping experience | Physics | 3 | Active |
| US8407632B2 | Detecting dose and focus variations during photolithography | Physics | 3 | Active |
| US11157267B1 | Evaluation of dynamic relationships between application components | Physics | 3 | Active |
| US8522173B2 | Spatial correlation-based estimation of yield of integrated circuits | Physics | 3 | Active |
| US8409882B2 | Differential FET structures for electrical monitoring of overlay | Electricity | 2 | Active |
| US11277425B2 | Anomaly and mode inference from time series data | Electricity | 2 | Active |
| US9147031B2 | Analysis of chip-mean variation and independent intra-die variation for chip yield determination | Physics | 2 | Active |
| US11349720B2 | Network management using hierarchical and multi-scenario graphs | Electricity | 2 | Active |
| US11204591B2 | Modeling and calculating normalized aggregate power of renewable energy source stations | Emerging Cross-Sectional Technologies | 2 | Active |
| US11048021B2 | Weather-driven multi-category infrastructure impact forecasting | Physics | 1 | Active |
| US7346868B2 | Method and system for evaluating design costs of an integrated circuit | Physics | 1 | Expired |
| US11888698B2 | Network management using hierarchical and multi-scenario graphs | Electricity | 1 | Active |
| US8276102B2 | Spatial correlation-based estimation of yield of integrated circuits | Physics | 1 | Active |
| US9841456B2 | Electric outage detection and localization | Emerging Cross-Sectional Technologies | 1 | Active |
| US11954474B2 | Generating compliant container images via embeddings | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.