Patent · US Active

Method for manufacturing a metal-semiconductor contact in semiconductor components

US7923362B2 · kind B2 · utility

0Cited by
16References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 6, 2006
Grant dateApr 12, 2011
Priority date
Expiry dateJun 6, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F71/00
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for manufacturing a metal-semiconductor contact in semiconductor Components is disclosed. There is a relatively high risk of contamination in the course of metal depositions in prior-art methods. In the disclosed method, the actual metal -semiconductor or Schottky contact is produced only after the application of a protective layer system, as a result of which it is possible to use any metals, particularly platinum, without the risk of contamination.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.