Method for manufacturing a metal-semiconductor contact in semiconductor components
US7923362B2 · kind B2 · utility
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16References
14Claims
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Key dates
| Filing date | Jun 6, 2006 |
| Grant date | Apr 12, 2011 |
| Priority date | — |
| Expiry date | Jun 6, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10F71/00
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method for manufacturing a metal-semiconductor contact in semiconductor Components is disclosed. There is a relatively high risk of contamination in the course of metal depositions in prior-art methods. In the disclosed method, the actual metal -semiconductor or Schottky contact is produced only after the application of a protective layer system, as a result of which it is possible to use any metals, particularly platinum, without the risk of contamination.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.