Patent · US Active

Fabrication of large grain polycrystalline silicon film by nano aluminum-induced crystallization of amorphous silicon

US7927937B2 · kind B2 · utility

6Cited by
1References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 10, 2010
Grant dateApr 19, 2011
Priority date
Expiry dateFeb 10, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02672
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

One aspect of the present invention relates to a method for fabricating a polycrystalline silicon film. In one embodiment, the method includes the steps of providing a substrate having a thermally-grown silicon dioxide layer, forming an amorphous silicon film on the thermally-grown silicon dioxide layer of the substrate, forming an aluminum layer on the amorphous silicon film to form a structure having the substrate, the amorphous silicon film and the aluminum layer, and annealing the structure at an annealing temperature for a period of time in an N2 environment with a ramp-up time to crystallize the amorphous silicon film to form a polycrystalline silicon film.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.