Vertical probe comprising slots and probe card for integrated circuit devices using the same
US7928749B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 15, 2010 |
| Grant date | Apr 19, 2011 |
| Priority date | — |
| Expiry date | Mar 15, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07314
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A vertical probe comprises a linear body, a tip portion connected to one side of the linear body, and at least one slot positioned on the linear body. In particular, the vertical probe includes a depressed structure having a plurality of slots positioned on the linear body in parallel and on one side of the linear body. The present application also provides a probe card for integrated circuit devices comprising an upper guiding plate having a plurality of fastening holes, a bottom guiding plate having a plurality of guiding holes and a plurality of vertical probes positioned in the guiding holes. The vertical probe includes a linear body positioned in the guiding holes, a tip portion connected to one side of the linear body and at least one slot positioned on the linear body.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.