STAR TECHNOLOGIES, INC.
🏢 View company profile →45Patents
32Active
45Granted
50Portfolio score
Filing activity: Jan 30, 1986 → Apr 3, 2023 · 13 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4862392A | Geometry processor for graphics display system | Physics | 182 | Expired |
| US6906543B2 | Probe card for electrical testing a chip in a wide temperature range | Physics | 67 | Expired |
| US4967375A | Fast architecture for graphics processor | Physics | 49 | Expired |
| US5327509A | Compressed image system for texture patterns | Physics | 36 | Expired |
| US5488687A | Dual resolution output system for image generators | Physics | 34 | Expired |
| US6758442B2 | Guided parafoil system for delivering lightweight payloads | Performing Operations; Transporting | 20 | Expired |
| US5173845A | High density frontplane interconnection system | Electricity | 18 | Expired |
| US7253646B2 | Probe card with tunable stage and at least one replaceable probe | Physics | 12 | Expired |
| US5124569A | Digital phase-lock loop system with analog voltage controlled oscillator | Electricity | 11 | Expired |
| US4815021A | Multifunction arithmetic logic unit circuit | Physics | 9 | Expired |
| US7576553B2 | Integrated circuit probing apparatus having a temperature-adjusting mechanism | Physics | 9 | Active |
| US7436171B2 | Apparatus for probing multiple integrated circuit devices | Physics | 7 | Active |
| US5485528A | Apparatus and method for back-projecting an image | Physics | 5 | Expired |
| US8035405B2 | Semiconductor devices testing apparatus with temperature-adjusting design | Physics | 4 | Active |
| US7295023B2 | Probe card | Physics | 4 | Expired |
| US8169227B2 | Probing apparatus with multiaxial stages for testing semiconductor devices | Physics | 3 | Active |
| US7616018B2 | Integrated circuit probing apparatus having a temperature-adjusting mechanism | Physics | 3 | Active |
| US9329205B2 | High-precision semiconductor device probing apparatus and system thereof | Physics | 2 | Active |
| US7928749B2 | Vertical probe comprising slots and probe card for integrated circuit devices using the same | Physics | 2 | Active |
| US5836826A | Machine for making star nails | Performing Operations; Transporting | 2 | Expired |
| US8692570B2 | Probe card for testing high-frequency signals | Physics | 1 | Active |
| US11054465B2 | Method of operating a probing apparatus | Physics | 1 | Active |
| US7791363B2 | Low temperature probing apparatus | Physics | 1 | Active |
| US11307246B2 | Probing apparatus and method of operating the same | Physics | 1 | Active |
| US8389926B2 | Testing apparatus for light-emitting devices with a design for a removable sensing module | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.