Contactless interfacing of test signals with a device under test
US7928750B2 · kind B2 · utility
131Cited by
66References
14Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 16, 2008 |
| Grant date | Apr 19, 2011 |
| Priority date | — |
| Expiry date | Dec 16, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07378
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An interface device receives test data from a tester. A signal representing the test data is transmitted to a device under test through electromagnetically coupled structures on the interface device and the device under test. The device under test processes the test data and generates response data. A signal representing the response data is transmitted to the interface device through electromagnetically coupled structures on the device under test and the interface device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.