Charles A. Miller
147Patents
51h-index
58Co-inventors
93Inventor score
Filing activity: Jun 23, 1988 → Feb 17, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6208225A | Filter structures for integrated circuit interfaces | Electricity | 172 | Expired |
| US6218910A | High bandwidth passive integrated circuit tester probe card assembly | Physics | 161 | Expired |
| US6910268B2 | Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via | Emerging Cross-Sectional Technologies | 156 | Expired |
| US7928750B2 | Contactless interfacing of test signals with a device under test | Physics | 131 | Active |
| US6539531B2 | Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes | Electricity | 130 | Expired |
| US4919266A | Carton with end wall display window | Performing Operations; Transporting | 126 | Expired |
| US6452411B1 | Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses | Physics | 119 | Expired |
| US6999987B1 | Screening and survey selection system and method of operating the same | Physics | 118 | Expired |
| US6499121B1 | Distributed interface for parallel testing of multiple devices using a single tester channel | Electricity | 106 | Expired |
| US6911835B2 | High performance probe system | Physics | 100 | Expired |
| US6538538B2 | High frequency printed circuit board via | Electricity | 98 | Expired |
| US6480978B1 | Parallel testing of integrated circuit devices using cross-DUT and within-DUT comparisons | Electricity | 98 | Expired |
| US6891385B2 | Probe card cooling assembly with direct cooling of active electronic components | Physics | 96 | Expired |
| US6501343B2 | Integrated circuit tester with high bandwidth probe assembly | Physics | 96 | Expired |
| US6622103B1 | System for calibrating timing of an integrated circuit wafer tester | Physics | 95 | Expired |
| US6882239B2 | Electromagnetically coupled interconnect system | Emerging Cross-Sectional Technologies | 94 | Expired |
| US6603323B1 | Closed-grid bus architecture for wafer interconnect structure | Emerging Cross-Sectional Technologies | 94 | Expired |
| US6339338B1 | Apparatus for reducing power supply noise in an integrated circuit | Physics | 93 | Expired |
| US6456103B1 | Apparatus for reducing power supply noise in an integrated circuit | Physics | 93 | Expired |
| US4984992A | Cable connector with a low inductance path | Electricity | 91 | Expired |
| US5249681A | Carton dispenser system | Performing Operations; Transporting | 90 | Expired |
| US6606575B2 | Cross-correlation timing calibration for wafer-level IC tester interconnect systems | Physics | 86 | Expired |
| US6657455B2 | Predictive, adaptive power supply for an integrated circuit under test | Physics | 85 | Expired |
| US6798225B2 | Tester channel to multiple IC terminals | Emerging Cross-Sectional Technologies | 83 | Expired |
| US6816031B1 | Adjustable delay transmission line | Physics | 83 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.