Device and method for evaluating electrostatic discharge protection capabilities
US7928753B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 4, 2006 |
| Grant date | Apr 19, 2011 |
| Priority date | — |
| Expiry date | Dec 25, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device and a method for evaluating ESD protection capabilities of an integrated circuit, the method includes: connecting multiple test probe to multiple integrated circuit testing points. The method is characterized by repeating the stages of: (i) charging a discharge capacitor to an ESD protection circuit triggering voltage level; (ii) connecting the discharge capacitor to the integrated circuit during a testing period such as to cause the discharge capacitor to interact with the integrated circuit; (iii) measuring at least one signal of the integrated circuit, during at least a portion of the testing period; and (iv) determining at least one ESD protection characteristic of the integrated circuit in response to the at least one signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.