Patent · US Active

Method to manufacture silicon quantum islands and single-electron devices

US7939398B2 · kind B2 · utility

1Cited by
14References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 16, 2009
Grant dateMay 10, 2011
Priority date
Expiry dateDec 10, 2029

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/962
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A method of manufacturing a single-electron transistor device is provided. The method includes forming a thinned region in a silicon substrate, the thinned region offset by a non-selected region. The method also includes forming at least one quantum island from the thinned region by subjecting the thinned region to an annealing process. The non-selected region is aligned with the quantum island and tunnel junctions are formed between the quantum island and the non-selected region. The present invention also includes a single-electron device, and a method of manufacturing an integrated circuit that includes a single-electron device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.