Electronic device testing system
US7941718B2 · kind B2 · utility
6Cited by
10References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 7, 2006 |
| Grant date | May 10, 2011 |
| Priority date | — |
| Expiry date | Feb 12, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318371
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for testing an electronic device is disclosed. The method includes loading a first test into a test pattern generator of a first device and generating a first test pattern at the test pattern generator. A second test seed is loaded into the test pattern generator while the first test pattern is being generated. In one embodiment, the state of the test pattern generator is modified based upon the second test seed, and the first test seed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.