Apparatus and method for measuring diode chip
US7952368B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 6, 2010 |
| Grant date | May 31, 2011 |
| Priority date | — |
| Expiry date | Sep 6, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2635
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and a method for measuring a diode chip are provided. The diode chip is placed on a thermal conductive element. The apparatus measures an instant starting current and a first temperature, which is associated with the instant starting current, of the thermal conductive element. After the diode chip operates, the apparatus adjusts the temperature of the thermal conductive element to a second temperature, such that the current of the diode chip is adjusted to be equal to the instant starting current. The apparatus calculates a property of the diode chip according to a real power of the diode chip and a difference between the first temperature and the second temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.