Methods, devices, and systems for experiencing reduced unequal testing degradation
US7966530B2 · kind B2 · utility
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2References
25Claims
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Key dates
| Filing date | Dec 18, 2007 |
| Grant date | Jun 21, 2011 |
| Priority date | — |
| Expiry date | Dec 20, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
One or more embodiments of the present invention reduce uneven degradation during testing by providing for a toggling signal to be applied to remaining input paths which do not receive test signals. Therefore, rather than being held in a fixed state during the burn-in process, the remaining inputs are toggled as well. Consequently, they degrade at a more similar rate as their counterpart inputs that did receive test signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.