Separate test electronics and blower modules in an apparatus for testing an integrated circuit
US7969175B2 · kind B2 · utility
24Cited by
3References
81Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 7, 2009 |
| Grant date | Jun 28, 2011 |
| Priority date | — |
| Expiry date | Aug 25, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2875
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to an apparatus for testing an integrated circuit of an electronic device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.