Correction of cluster defects in imagers
US7969488B2 · kind B2 · utility
5Cited by
6References
27Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 3, 2005 |
| Grant date | Jun 28, 2011 |
| Priority date | — |
| Expiry date | May 27, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2209/046
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus that allows for the correction of multiple defective pixels in an imager device. In one exemplary embodiment, the method includes the steps of selecting a correction kernel for a defective pixel, determining average and difference values for pixel pairs in the correction kernel, and substituting an average value from a pixel pair for the value of the defective pixel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.