Micron Technologies, Inc.
76Patents
50Active
76Granted
62Portfolio score
Filing activity: Apr 6, 1992 → Dec 29, 2023 · 16 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6084302A | Barrier layer cladding around copper interconnect lines | Electricity | 153 | Expired |
| US7671459B2 | Microelectronic devices, stacked microelectronic devices, and methods for manufacturing such devices | Electricity | 141 | Expired |
| US5990903A | Method and apparatus for performing chroma key, transparency and fog operations | Physics | 78 | Expired |
| US6180450A | Semiconductor processing methods of forming stacked capacitors | Electricity | 76 | Expired |
| US5196360A | Methods for inhibiting outgrowth of silicide in self-aligned silicide process | Emerging Cross-Sectional Technologies | 73 | Expired |
| US6198168A | Integrated circuits using high aspect ratio vias through a semiconductor wafer and method for forming same | Electricity | 71 | Expired |
| US5634974A | Method for forming hemispherical grained silicon | Emerging Cross-Sectional Technologies | 68 | Expired |
| US8680888B2 | Methods and systems for routing in a state machine | Physics | 64 | Active |
| US7847282B2 | Vertical tunneling transistor | Emerging Cross-Sectional Technologies | 49 | Active |
| US5756404A | Two-step nitride deposition | Electricity | 48 | Expired |
| US5698455A | Method for predicting process characteristics of polyurethane pads | Performing Operations; Transporting | 48 | Expired |
| US5323350A | Integrated circuit memory with dual P-sense amplifiers associated with each column line | Physics | 40 | Expired |
| US6504255B2 | Digit line architecture for dynamic memory | Physics | 24 | Expired |
| US6121126A | Methods and structures for metal interconnections in integrated circuits | Emerging Cross-Sectional Technologies | 22 | Expired |
| US7601608B2 | Memory array buried digit line | Electricity | 21 | Active |
| US8741758B2 | Cross-hair cell wordline formation | Electricity | 18 | Active |
| US7517804B2 | Selective etch chemistries for forming high aspect ratio features and associated structures | Electricity | 11 | Active |
| US5901194A | Timer circuit with programmable decode circuitry | Electricity | 10 | Expired |
| US5898625A | Fast power up reference voltage circuit and method | Physics | 9 | Expired |
| US5956611A | Field emission displays with reduced light leakage | Electricity | 9 | Expired |
| US6069832A | Method for multiple staged power up of integrated circuit | Physics | 8 | Expired |
| US7619669B2 | Power savings with multiple readout circuits | Electricity | 7 | Active |
| US7848158B2 | Methods and apparatuses for programming flash memory using modulated pulses | Physics | 6 | Active |
| US9299442B2 | Dynamic data caches, decoders and decoding methods | Physics | 6 | Active |
| US5923040A | Wafer sample retainer for an electron microscope | Electricity | 6 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.