Patent · US Active

Bonding apparatus and wire bonding method

US7975901B2 · kind B2 · utility

22Cited by
3References
13Claims
0Family size

Assignees

Inventors

Key dates

Filing dateJun 7, 2010
Grant dateJul 12, 2011
Priority date
Expiry dateJun 7, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/01082
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A bonding apparatus including a chamber for maintaining an inert gas atmosphere; a first plasma torch for performing a surface treatment on pads and electrodes, the first plasma torch being attached in the chamber, to apply gas plasma to a substrate and a semiconductor chip that is placed inside the chamber; a second plasma torch for performing a surface treatment on an initial ball and/or wire at a tip end of a capillary that is positioned inside the chamber, the second plasma torch being attached in the chamber, to apply gas plasma to the initial ball and/or wire; and a bonding unit for bonding the surface-treated initial ball and/or wire to the surface-treated pads and electrodes in the chamber, thereby cleaning of the surface of the electrodes and pads as well as the wire can be effectively performed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.