Apparatus and method for testing electrical interconnects with switches
US7982468B2 · kind B2 · utility
2Cited by
10References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 13, 2008 |
| Grant date | Jul 19, 2011 |
| Priority date | — |
| Expiry date | Apr 30, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2808
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test system including a package with switchable paths. The package may have conductive paths that are selected by switches. The electrically switchable conductive paths may yield increased data without significantly increasing the required testing hardware.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.