Patent · US Active

Measurement arrangement for determining the characteristic line parameters by measuring scattering parameters

US7990158B2 · kind B2 · utility

1Cited by

4References

16Claims

0Family size

Assignee

International Business Machines Corporation · US

Inventors

Thomas Ludwig · Sindelfingen, DE
Helmut Schettler · Waldenbuch, DE
Thomas-Michael Winkel · Eppelheim, DE

Key dates

Filing date	Mar 19, 2008
Grant date	Aug 2, 2011
Priority date	—
Expiry date	Jun 27, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2837
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present invention relates to a measurement arrangement for determining the characteristic line parameters by measuring the S-parameters as a function of the frequency of transmission lines. A voltage mesh and a ground mesh in a metal layer are connected symmetrically to a reference ground (RG) in the layer at all ends.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.