Optical lattice microscopy using periodic interference patterns of coherent waves
US7990611B2 · kind B2 · utility
Inventor
Key dates
| Filing date | May 22, 2007 |
| Grant date | Aug 2, 2011 |
| Priority date | — |
| Expiry date | Dec 3, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/653
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A microscope includes a source of electromagnetic radiation, having a wavelength, λ1 and dividing optical elements configured for dividing the radiation from the source into multiple excitation beams. The microscope also includes a detector and directing optical elements, which are configured for directing each excitation beam in unique directions, such that the beams intersect in an excitation region within a sample to create a two-dimensional or three-dimensional interference pattern of multiple excitation maxima within the sample. The detector has individual detector elements, where the detector elements are configured for detecting light resulting from an interaction of an individual excitation maximum and the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.