Patent · US Active

Calibrating jitter

US7991046B2 · kind B2 · utility

1Cited by

2References

17Claims

0Family size

Assignee

Teradyne, Inc. · US

Inventors

Ronald A. Sartschev · Dunstable, US
Ernest P. Walker · Weston, US
Li-Ju Huang · Tainan, TW

Key dates

Filing date	May 18, 2007
Grant date	Aug 2, 2011
Priority date	—
Expiry date	May 5, 2029

Classification

Technology area (CPC H)Electricity
CPC primaryH04B17/21
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Calibrating jitter in a communication channel between test equipment and a connection for a device under test (DUT) includes sampling test data in the communication channel at about a point of the connection to produce sampled data, where the test data travels through the communication channel at a first rate, and where the test data is sampled at a second rate that is less than the first rate, determining a first amount of jitter in the sampled data relative to the test data, and determining a second amount of jitter at about the point of connection based on the first amount of jitter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.