Method and apparatus for inspecting components
US7995829B2 · kind B2 · utility
3Cited by
16References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 1, 2007 |
| Grant date | Aug 9, 2011 |
| Priority date | — |
| Expiry date | Jun 8, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for inspecting a component is provided. The method includes generating an image of the component, generating a signal indication mask, and generating a noise mask using a signal within the signal indication mask. The noise mask facilitates reducing a quantity of prospective signals contained in the signal indication mask. The method further includes utilizing the signal indication mask and the generated noise mask to calculate the signal-to-noise ratio of at least one potential flaw indication that may be present in the image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.