High frequency deflection measurement of IR absorption
US8001830B2 · kind B2 · utility
24Cited by
3References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 15, 2007 |
| Grant date | Aug 23, 2011 |
| Priority date | — |
| Expiry date | Jun 28, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/3563
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.