Anasys Instruments
18Patents
17Active
18Granted
49Portfolio score
Filing activity: Apr 18, 2006 → Apr 14, 2017 · 4 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8177422B2 | Transition temperature microscopy | Physics | 33 | Active |
| US9046492B1 | Stimulated raman nanospectroscopy | Physics | 26 | Active |
| US8793811B1 | Method and apparatus for infrared scattering scanning near-field optical microscopy | Physics | 25 | Active |
| US8001830B2 | High frequency deflection measurement of IR absorption | Physics | 24 | Active |
| US7497613B2 | Probe with embedded heater for nanoscale analysis | Physics | 22 | Expired |
| US8402819B2 | High frequency deflection measurement of IR absorption | Physics | 20 | Active |
| US8242448B2 | Dynamic power control, beam alignment and focus for nanoscale spectroscopy | Physics | 18 | Active |
| US9658247B2 | Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy | Physics | 18 | Active |
| US9372154B2 | Method and apparatus for infrared scattering scanning near-field optical microscopy | Physics | 18 | Active |
| US8869602B2 | High frequency deflection measurement of IR absorption | Physics | 17 | Active |
| US8607622B2 | High frequency deflection measurement of IR absorption | Physics | 15 | Active |
| US8646319B2 | Dynamic power control for nanoscale spectroscopy | Performing Operations; Transporting | 15 | Active |
| US8387443B2 | Microcantilever with reduced second harmonic while in contact with a surface and nano scale infrared spectrometer | Physics | 10 | Active |
| US7977636B2 | Infrared imaging using thermal radiation from a scanning probe tip | Physics | 7 | Active |
| US8914911B2 | Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy | Physics | 6 | Active |
| US8680467B2 | High frequency deflection measurement of IR absorption with a modulated IR source | Physics | 4 | Active |
| US8418538B2 | High frequency deflection measurement of IR absorption | Physics | 3 | Active |
| US9778282B2 | Method and apparatus for infrared scattering scanning near-field optical microscopy with high speed point spectroscopy | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.