Atomic layer deposition (ALD) method and reactor for producing a high quality layer
US8007865B2 · kind B2 · utility
8Cited by
2References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 31, 2006 |
| Grant date | Aug 30, 2011 |
| Priority date | — |
| Expiry date | May 14, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/02274
- WIPO fieldSurface technology, coating
- WIPO sectorChemistry
Abstract
One inventive aspect is related to an atomic layer deposition (ALD) method comprising:
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.