Patent · US Active

Method and apparatus for identifying outliers following burn-in testing

US8010310B2 · kind B2 · utility

1Cited by

3References

14Claims

0Family size

Assignee

Advanced Micro Devices, Inc. · US

Inventors

Rajesh Vijayaraghavan · Austin, US
Benjamin Ertle · Austin, US
James Routh · Austin, US
Paul A. Ferno · Dripping Springs, US

Key dates

Filing date	Jul 27, 2007
Grant date	Aug 30, 2011
Priority date	—
Expiry date	Nov 2, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/287
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method includes performing burn-in testing of a device in a tester to generate post burn-in data. Pre-burn-in data associated with the device is compared to the post burn-in data. The device is identified as an outlier device based on the comparison.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.