Test apparatus and driver circuit
US8013626B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 31, 2009 |
| Grant date | Sep 6, 2011 |
| Priority date | — |
| Expiry date | Apr 8, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L25/0278
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is a test apparatus that tests a device under test, comprising a driver circuit that generates an output signal according to a prescribed input pattern and supplies the output signal to the device under test; and a measuring section that judges acceptability of the device under test by measuring a response signal output by the device under test. The driver circuit includes an input terminal that receives the input pattern; a switching section that operates according to a logic value of the input pattern to generate the output signal; and an emphasized component generating section that is provided between the input terminal and the switching section, and that (i) generates an emphasized component according to a prescribed high frequency component of the input pattern and (ii) superimposes the emphasized component onto a voltage supplied to the switching section.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.