Patent · US Active

Method of increasing etchability of metals having chemical etching resistant microstructure

US8017028B2 · kind B2 · utility

0Cited by
7References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 14, 2008
Grant dateSep 13, 2011
Priority date
Expiry dateJan 30, 2030

Classification

  • Technology area (CPC F)Mechanical Engineering; Lighting; Heating
  • CPC primaryF16K2099/0076
  • WIPO fieldMechanical elements
  • WIPO sectorMechanical engineering

Abstract

A space-conserving integrated fluid delivery system which is particularly useful for gas distribution in semiconductor processing equipment. The invention also includes an integrated fluid flow network architecture, which may include, in addition to a layered substrate containing fluid flow channels, various fluid handling and monitoring components. The layered substrate is diffusion bonded, and the various fluid handling and monitoring components may be partially integrated or fully integrated into the substrate, depending on design and material requirements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.