Method of increasing etchability of metals having chemical etching resistant microstructure
US8017028B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 14, 2008 |
| Grant date | Sep 13, 2011 |
| Priority date | — |
| Expiry date | Jan 30, 2030 |
Classification
- Technology area (CPC F)Mechanical Engineering; Lighting; Heating
- CPC primaryF16K2099/0076
- WIPO fieldMechanical elements
- WIPO sectorMechanical engineering
Abstract
A space-conserving integrated fluid delivery system which is particularly useful for gas distribution in semiconductor processing equipment. The invention also includes an integrated fluid flow network architecture, which may include, in addition to a layered substrate containing fluid flow channels, various fluid handling and monitoring components. The layered substrate is diffusion bonded, and the various fluid handling and monitoring components may be partially integrated or fully integrated into the substrate, depending on design and material requirements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.