High resolution and flexible eddy current array probe
US8018228B2 · kind B2 · utility
3Cited by
4References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 12, 2009 |
| Grant date | Sep 13, 2011 |
| Priority date | — |
| Expiry date | Mar 13, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/904
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a method and an NDT/NDI probe deploying a slit or a flexible joint of probe bending region, preferably between two rows of probe elements to allow free bending between rows of probe elements and along the direction of the rows of elements and to allow two adjacent rows of elements to bend individually along its own natural bending lines perpendicular to the direction of the rows of elements. Also disclosed is the use of protective flexible pads to cover the probe elements and other probe components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.