Patent · US Active

Substrate processing apparatus and substrate processing method

US8020570B2 · kind B2 · utility

3Cited by
3References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 26, 2007
Grant dateSep 20, 2011
Priority date
Expiry dateJul 12, 2030

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S134/902
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A part of the opening of the nozzle insertion hole located in the liquid discharging direction relative to the nozzle inserted in the nozzle insertion hole is enlarged in the liquid discharging direction. Therefore, the droplets which have migrated to the nozzle insertion hole adheres to the internal surface in the liquid discharging direction relative to the nozzle, that is, to the slanted part via the enlarged part. Moreover, the slanted part is provided slanted from the central portion of the nozzle insertion hole toward the enlarged part and separated away from the central portion of the substrate top surface. Hence, the adhering droplets flow in the liquid discharging direction along the slanted part to be discharged from the opening of the nozzle insertion hole.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.