Patent · US Active

Back grinding method for wafer

US8025553B2 · kind B2 · utility

2Cited by
0References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 17, 2008
Grant dateSep 27, 2011
Priority date
Expiry dateJul 27, 2030

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B7/228
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A back grinding method for a wafer includes covering a face-side surface of the wafer with a resin film, and cutting the surface of the resin film to form a flat surface parallel to the face-side surface of the wafer. The wafer is held with the surface of the resin film in contact with a suction surface of a chuck table in a grinding apparatus, and the exposed back-side surface of the wafer is ground. Unevenness in thickness of the resin film is suppressed, whereby the thickness of the wafer subjected to back grinding is made to be uniform.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.