Patent · US Active

Method of fabricating nitride-based compound layer, GaN substrate and vertical structure nitride-based semiconductor light emitting device

US8026156B2 · kind B2 · utility

2Cited by
9References
8Claims
0Family size

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Key dates

Filing dateJun 23, 2009
Grant dateSep 27, 2011
Priority date
Expiry dateJul 7, 2029

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10H20/018
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a method for fabricating a nitride-based compound layer, first, a GaN substrate is prepared. A mask layer with a predetermined pattern is formed on the GaN substrate to expose a partial area of the GaN substrate. Then a buffer layer is formed on the partially exposed GaN substrate. The buffer layer is made of a material having a 10% or less lattice mismatch with GaN. Thereafter, the nitride-based compound is grown laterally from a top surface of the buffer layer toward a top surface of the mask layer and the nitride-based compound layer is vertically grown to a predetermined thickness. Also, the mask layer and the buffer layer are removed via wet-etching to separate the nitride-based compound layer from the GaN substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.