Method and apparatus for identifying broken pins in a test socket
US8040140B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 15, 2010 |
| Grant date | Oct 18, 2011 |
| Priority date | — |
| Expiry date | Nov 15, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/308
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method includes scanning a test socket after removal of a device under test to generate scan data. The scan data is compared to reference data. A presence of at least a portion of a pin in the test socket is identified based on the comparison. A test system includes a test socket, a scanner, and a control unit. The test socket is operable to receive devices under test. The scanner is operable to scan a test socket after removal of a device under test to generate scan data. The control unit is operable to compare the scan data to reference data and identify a presence of at least a portion of a pin in the test socket based on the comparison.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.