Flexible array probe for the inspection of a contoured surface with varying cross-sectional geometry
US8049494B2 · kind B2 · utility
10Cited by
1References
37Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 20, 2008 |
| Grant date | Nov 1, 2011 |
| Priority date | — |
| Expiry date | Aug 11, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2638
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A flexible array probe is disclosed suitable for use in the non-destructive testing and inspection of test pieces with varying cross-sectional geometries. Array elements—such as, but not limited to, eddy current sensors, piezoelectric sensor elements, and magnetic flux leakage sensors—are mounted on thin alignment fins and coupled together with pairs of pivot mechanisms along the axis of desired rotation. The pivot mechanisms allow rotation in exactly one dimension and force the flexible array probe to align its elements orthogonally to the surface of the structure under test. Alignment and coupling fixtures are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.