Method for planning an inspection path for determining areas that are to be inspected
US8059151B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 10, 2005 |
| Grant date | Nov 15, 2011 |
| Priority date | — |
| Expiry date | Mar 19, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/37563
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for planning an inspection path (2) for at least one optical picture-taking device (4), particularly a camera, for inspecting a three-dimensional object (3). The picture-taking device (4) and the object (3) are movable relative to each other by means of a displacement device (5, 6). To ensure that the method for planning inspection paths and for determining areas to be inspected is easy to use and reliably covers all areas to be inspected, it is provided that, based on the design data (8), particularly CAD data and/or data determined by a sensor, relating to the object (3) and/or an area (12) to be inspected on the object, and based on the optical imaging characteristics of the picture-taking device (4), stored in electronic form, and using an arithmetic logic unit (10), the inspection path (2) for the optical picture-taking device (4) is automatically determined by specifying a specific geometric relationship between the picture-taking device (4) and the surface to be inspected.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.