Enis Ersue
5Patents
5h-index
4Co-inventors
42Inventor score
Filing activity: Feb 10, 2005 → Feb 8, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8520067B2 | Method for calibrating a measuring system | Physics | 53 | Active |
| US7639349B2 | Method and system for inspecting surfaces | Physics | 8 | Expired |
| US8059151B2 | Method for planning an inspection path for determining areas that are to be inspected | Physics | 8 | Active |
| US7602507B2 | Sensor for measuring the surface of an object | Physics | 7 | Expired |
| US7499812B2 | Method for locating flaws, and a marking system | Physics | 6 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.