Method for integration of replacement gate in CMOS flow
US8062966B2 · kind B2 · utility
16Cited by
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20Claims
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Key dates
| Filing date | Dec 24, 2009 |
| Grant date | Nov 22, 2011 |
| Priority date | — |
| Expiry date | Jun 7, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D30/0227
Abstract
Semiconductor devices and fabrication methods are provided, in which metal transistor replacement gates are provided for CMOS transistors. The process provides dual or differentiated work function capability (e.g., for PMOS and NMOS transistors) in CMOS processes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.