Patent · US Active

Method for integration of replacement gate in CMOS flow

US8062966B2 · kind B2 · utility

16Cited by
0References
20Claims
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Key dates

Filing dateDec 24, 2009
Grant dateNov 22, 2011
Priority date
Expiry dateJun 7, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/0227

Abstract

Semiconductor devices and fabrication methods are provided, in which metal transistor replacement gates are provided for CMOS transistors. The process provides dual or differentiated work function capability (e.g., for PMOS and NMOS transistors) in CMOS processes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.