Apparatus and method for measuring characteristic and chip temperature of LED
US8075182B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 8, 2008 |
| Grant date | Dec 13, 2011 |
| Priority date | — |
| Expiry date | Oct 12, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K2217/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring a characteristic and a chip temperature of an LED includes a thermal conductive component. An LED chip is disposed on the thermal conductive component. A temperature control unit is connected to the thermal conductive component for providing a temperature to the thermal conductive component, and therefore providing the temperature to the LED chip via the thermal conductive component. A power-source and voltage-meter unit provides a current to the LED chip, and measures a voltage value of the LED chip. Under a measurement mode, the current is featured with a current waveform having a high current level and a low current level which are alternatively changed, for applying to the LED chip. Measurements are conducted respectively corresponding to the high current level and the low current level, and a correlation curve between the voltage and the temperature can be obtained with the results of measurement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.