Patent · US Active

Spray cooling thermal management system and method for semiconductor probing, diagnostics, and failure analysis

US8076951B2 · kind B2 · utility

0Cited by
23References
13Claims
0Family size

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Key dates

Filing dateMar 11, 2009
Grant dateDec 13, 2011
Priority date
Expiry dateMar 11, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2891
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A micro-spray cooling system beneficial for use in testers of electrically stimulated integrated circuit chips is disclosed. The system includes micro-spray heads disposed about a probe head. The spray heads and probe head are disposed in a sealed manner inside a spray chamber that, during operation, is urged in a sealing manner onto a sealing plate holding the integrated circuit under test. The atomized mist cools the integrated circuit and then condenses on the spray chamber wall. The condensed fluid is pumped out of the chamber and is circulated in a chiller, so as to be re-circulated and injected again into the micro-spray heads. The pressure inside the spray chamber may be controlled to provide a desired boiling point.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.