Circuit arrangement with a test circuit and a reference circuit and corresponding method

US8081003B2 · kind B2 · utility

Assignee

• Infineon Technologies AG · DE

Inventors

• Christian Pacha · Birkenfeld, DE
• Thomas Baumann · Wettingen, CH
• Georg Georgakos · Fraunberg, DE
• Anselme Urlick Tchegho Kamgaing · Aachen, DE

Key dates

• Filing date: Feb 2, 2009
• Grant date: Dec 20, 2011
• Expiry date: Jun 21, 2030

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31703
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Implementations are presented herein that include a test circuit and a reference circuit.