Wafer-level In-P Si bonding for silicon photonic apparatus
US8084282B2 · kind B2 · utility
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12Claims
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Key dates
| Filing date | Apr 2, 2010 |
| Grant date | Dec 27, 2011 |
| Priority date | — |
| Expiry date | Apr 2, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01S5/34306
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Wafer-level bonding of the hybrid laser portion of a silicon photonics platform is done by forming a weakened level in a semiconductive pillar that supports laser-active layers by ion implantation into the semiconductive pillar without penetrating the laser-active layers, and by separating the laser-active layers from the semiconductive pillar by cracking the weakened level by an epitaxial lift-off processes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.