Patent · US Active

Calibration device and laser scanning microscope with such a calibration device

US8115164B2 · kind B2 · utility

2Cited by

2References

20Claims

0Family size

Assignee

Carl Zeiss Micromanaging GmbH · DE

Inventors

Ralf Netz · Jena, DE
Wolfgang Bathe · Jena, DE
Joerg Steinert · Jena, DE
Werner Kleinschmidt · Dransfeld, DE
Ingo Fahlbusch · Göttingen, DE
Michael James Brehm · Allen, US

Key dates

Filing date	Jan 29, 2009
Grant date	Feb 14, 2012
Priority date	—
Expiry date	Aug 29, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG02B27/32
WIPO fieldOptics
WIPO sectorInstruments

Abstract

A calibration device for managing a variety of performance tests and/or calibration tasks in a laser scanning microscope. The calibration device, which has focusing optics and a test structure arranged in the focal plane of the focusing optics, with structural elements detectable in reflected and/or transmitted light aligned to each other in a common mounting, can be switched into the microscope beam path in a laser scanning microscope, so that the pupil of the focusing optics coincides with the objective pupil of the laser scanning microscope or lies in a plane conjugated to it.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.