Inventor · Jena, DE

Ralf Netz

42Patents
4h-index
33Co-inventors
59Inventor score

Filing activity: Apr 6, 2007 → Feb 6, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US8705172B2 Microscopy method and microscope with enhanced resolution Physics 18 Active
US9671603B2 Optical arrangement and light microscope Physics 7 Active
US9632296B2 High-resolution scanning microscopy Physics 5 Active
US9404867B2 Luminescence microscopy Physics 4 Active
US10261300B2 Light microscope and method for image recording using a light microscope Physics 3 Active
US10317657B2 High-resolution scanning microscopy Electricity 3 Active
US8908271B2 Laser scanning microscope and its operating method Physics 3 Active
US9470883B2 High-resolution scanning microscopy Physics 3 Active
US10095017B2 Microscope and microscopy method Physics 3 Active
US9864182B2 High-resolution scanning microscopy Physics 3 Active
US9989746B2 Light microscope and microscopy method Physics 3 Active
US9671600B2 Light microscope and microscopy method Physics 3 Active
US9645375B2 Light microscope and microscopy method Physics 2 Active
US10281701B2 High-resolution scanning microscopy Physics 2 Active
US10983322B2 Single plane illumination microscope Physics 2 Active
US8115164B2 Calibration device and laser scanning microscope with such a calibration device Physics 2 Active
US11598941B2 Method for operating a light microscope with structured illumination and optic arrangement Physics 1 Active
US10663749B2 Light microscope and optical assembly to provide structured illuminating light to examine samples Physics 1 Active
US11555991B2 Method for illuminating samples in microscopic imaging methods Physics 1 Active
US7656583B2 Beam combiner employing a wedge-shaped cross-section Physics 1 Active
US10133046B2 Optical arrangement and light microscope Physics 1 Active
US8120771B2 Configuration of a laser scanning microscope for raster image correlation spectroscopy measurement and method for conducting and evaluating such a measurement Physics 1 Active
US11194144B2 Microscopy method using temporal focus modulation, and microscope Physics 1 Active
US9791686B2 High-resolution scanning microscopy Physics 1 Active
US11372223B2 High-resolution scanning microscopy Electricity 1 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.