THz investigation apparatus and method
US8138477B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 18, 2007 |
| Grant date | Mar 20, 2012 |
| Priority date | — |
| Expiry date | May 18, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/4338
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for measurement of a sample comprises means for generating electromagnetic radiation comprising a photoconductive device, the generating means is arranged to generate an output signal comprising electromagnetic radiation in dependence upon radiation received by the photoconductive device and to transmit the output signal towards a sample space, the apparatus further comprises a first radiation source and a second radiation source, arranged such that the radiation received by the photoconductive device comprises a mixture of radiation from the first radiation source and radiation from the second radiation source, control means for varying the frequency of the electromagnetic radiation of the output signal by varying the temperature of the first radiation source and/or the temperature of the second radiation source, and detecting means for detecting a response signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.