Enhanced characterization of electrical connection degradation
US8140277B2 · kind B2 · utility
1Cited by
2References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 31, 2009 |
| Grant date | Mar 20, 2012 |
| Priority date | — |
| Expiry date | May 28, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31717
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
One embodiment provides a system that analyzes an electrical connection in a computer system. During operation, the system monitors a reflection coefficient associated with the electrical connection and applies a sequential-analysis technique to the reflection coefficient to determine a statistical deviation of the reflection coefficient. Next, the system assesses the integrity of the electrical connection based on the statistical deviation of the reflection coefficient. Finally, the system uses the assessed integrity to maintain the electrical connection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.