Dimensional measurement probe
US8140287B2 · kind B2 · utility
4Cited by
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19Claims
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Assignee
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Key dates
| Filing date | Jul 21, 2010 |
| Grant date | Mar 20, 2012 |
| Priority date | — |
| Expiry date | Jul 21, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/012
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for measuring the dimensions of objects on a coordinate positioning machine such as a machine tool has a workpiece-contacting stylus. This is suspended via a sensor mechanism, including strain gauges which provide an output when the stylus contacts a workpiece. A processor processes the strain gauge outputs to produce a trigger signal. It does so in accordance with an algorithm or equation or look-up table which ensures equal sensitivity in all possible directions of approach to the workpiece in the three dimensions X, Y, Z.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.